Publication detail
An ellipsometric study of W thin films deposited on Si
Deineka AG, Tarasenko AA, Jastrabik L, Chvostova D, Bousek J
Original Title
An ellipsometric study of W thin films deposited on Si
Type
journal article - other
Language
English
Authors
Deineka AG, Tarasenko AA, Jastrabik L, Chvostova D, Bousek J
Released
10. 2. 1999
Publisher
Elsevier
ISBN
0040-6090
Periodical
Thin Solid Films
Year of study
Volume 339
Number
1-2
State
Kingdom of the Netherlands
Pages from
216
Pages to
219
Pages count
4
BibTex
@article{BUT50574,
author="Jaroslav {Boušek}",
title="An ellipsometric study of W thin films deposited on Si",
journal="Thin Solid Films",
year="1999",
volume="Volume 339",
number="1-2",
pages="216--219",
issn="0040-6090"
}