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Publication detail
Deineka AG, Tarasenko AA, Jastrabik L, Chvostova D, Bousek J
Original Title
An ellipsometric study of W thin films deposited on Si
Type
journal article - other
Language
English
Authors
Released
10. 2. 1999
Publisher
Elsevier
ISBN
0040-6090
Periodical
Thin Solid Films
Year of study
Volume 339
Number
1-2
State
Kingdom of the Netherlands
Pages from
216
Pages to
219
Pages count
4
BibTex
@article{BUT50574, author="Jaroslav {Boušek}", title="An ellipsometric study of W thin films deposited on Si", journal="Thin Solid Films", year="1999", volume="Volume 339", number="1-2", pages="216--219", issn="0040-6090" }