Publication detail

X-RAY MICROANALYSIS IN ESEM AND LV SEM

AUTRATA, R., JIRÁK, J., ŠPINKA, J.

Original Title

X-RAY MICROANALYSIS IN ESEM AND LV SEM

Type

conference paper

Language

English

Original Abstract

This article presents the advantageous metod for the X-ray microanalysis in ESEM which enables to assess the true specimen composition via mesurement of 4 or 5 values of the counts per second for different pressures.

Key words in English

X-ray microanalysis, ESEM, LV SEM,

Authors

AUTRATA, R., JIRÁK, J., ŠPINKA, J.

RIV year

2002

Released

8. 7. 2002

Publisher

Institute of Scientific Instruments Academy of Sciences of the Czech republic, Czechoslovak Microscopy Society

Location

Czech republic, Brno

ISBN

80-238-8986-9

Book

Recent Trends in Charged Particle Optics and Surface Physics Instrumentation

Pages from

49

Pages to

50

Pages count

2

BibTex

@inproceedings{BUT5198,
  author="Rudolf {Autrata} and Josef {Jirák} and Jiří {Špinka}",
  title="X-RAY MICROANALYSIS IN ESEM AND LV SEM",
  booktitle="Recent Trends in Charged Particle Optics and Surface Physics Instrumentation",
  year="2002",
  pages="2",
  publisher="Institute of Scientific Instruments Academy of Sciences of the Czech republic, 
Czechoslovak Microscopy Society
",
  address="Czech republic, Brno",
  isbn="80-238-8986-9"
}