Detail publikace

X-RAY MICROANALYSIS IN ESEM AND LV SEM

AUTRATA, R., JIRÁK, J., ŠPINKA, J.

Originální název

X-RAY MICROANALYSIS IN ESEM AND LV SEM

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This article presents the advantageous metod for the X-ray microanalysis in ESEM which enables to assess the true specimen composition via mesurement of 4 or 5 values of the counts per second for different pressures.

Klíčová slova v angličtině

X-ray microanalysis, ESEM, LV SEM,

Autoři

AUTRATA, R., JIRÁK, J., ŠPINKA, J.

Rok RIV

2002

Vydáno

8. 7. 2002

Nakladatel

Institute of Scientific Instruments Academy of Sciences of the Czech republic, Czechoslovak Microscopy Society

Místo

Czech republic, Brno

ISBN

80-238-8986-9

Kniha

Recent Trends in Charged Particle Optics and Surface Physics Instrumentation

Strany od

49

Strany do

50

Strany počet

2

BibTex

@inproceedings{BUT5198,
  author="Rudolf {Autrata} and Josef {Jirák} and Jiří {Špinka}",
  title="X-RAY MICROANALYSIS IN ESEM AND LV SEM",
  booktitle="Recent Trends in Charged Particle Optics and Surface Physics Instrumentation",
  year="2002",
  pages="2",
  publisher="Institute of Scientific Instruments Academy of Sciences of the Czech republic, 
Czechoslovak Microscopy Society
",
  address="Czech republic, Brno",
  isbn="80-238-8986-9"
}