Publication detail

Deposition and Measurement of Antireflection Coatings for Semiconductor Laser

RŮŽIČKA, B.

Original Title

Deposition and Measurement of Antireflection Coatings for Semiconductor Laser

Type

conference paper

Language

English

Original Abstract

This contribution presents experimental results obtained by deposition double-layer system made by means of electron-beam vacuum evaporation technique. We oriented our effort to short-wavelength 633 - 635 nm laser diodes. These devices are emitting close to the wavelength of traditional He-Ne lasers with an intention to use them in extended-cavity laser design for metrological purposes. The resulting reflectivities were evaluated by measuring a testing plate of GaAs and by measuring a "modulation depth" of a coated diode emission spectra. Our best results were reflectivities well below 10-4 and the repeatibility of the deposition process in a range not exceeding 2x10-4.

Keywords

laser diode, antireflection coating, ECL

Authors

RŮŽIČKA, B.

RIV year

2001

Released

1. 1. 2001

Publisher

Ing.Zdeněk Novotný

Location

Brno

ISBN

80-214-1860-5

Book

Proceedings of 7th conference Student FEI 2001

Pages from

291

Pages to

295

Pages count

5

BibTex

@inproceedings{BUT5981,
  author="Bohdan {Růžička}",
  title="Deposition and Measurement of Antireflection Coatings for Semiconductor Laser",
  booktitle="Proceedings of 7th conference Student FEI 2001",
  year="2001",
  pages="5",
  publisher="Ing.Zdeněk Novotný",
  address="Brno",
  isbn="80-214-1860-5"
}