Detail publikace

Deposition and Measurement of Antireflection Coatings for Semiconductor Laser

RŮŽIČKA, B.

Originální název

Deposition and Measurement of Antireflection Coatings for Semiconductor Laser

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This contribution presents experimental results obtained by deposition double-layer system made by means of electron-beam vacuum evaporation technique. We oriented our effort to short-wavelength 633 - 635 nm laser diodes. These devices are emitting close to the wavelength of traditional He-Ne lasers with an intention to use them in extended-cavity laser design for metrological purposes. The resulting reflectivities were evaluated by measuring a testing plate of GaAs and by measuring a "modulation depth" of a coated diode emission spectra. Our best results were reflectivities well below 10-4 and the repeatibility of the deposition process in a range not exceeding 2x10-4.

Klíčová slova

laser diode, antireflection coating, ECL

Autoři

RŮŽIČKA, B.

Rok RIV

2001

Vydáno

1. 1. 2001

Nakladatel

Ing.Zdeněk Novotný

Místo

Brno

ISBN

80-214-1860-5

Kniha

Proceedings of 7th conference Student FEI 2001

Strany od

291

Strany do

295

Strany počet

5

BibTex

@inproceedings{BUT5981,
  author="Bohdan {Růžička}",
  title="Deposition and Measurement of Antireflection Coatings for Semiconductor Laser",
  booktitle="Proceedings of 7th conference Student FEI 2001",
  year="2001",
  pages="5",
  publisher="Ing.Zdeněk Novotný",
  address="Brno",
  isbn="80-214-1860-5"
}