Publication detail

Nanometrology, scanning probe microscopy and related techniques

TOMÁNEK, P. SPAJER, M.

Original Title

Nanometrology, scanning probe microscopy and related techniques

Type

conference proceedings

Language

English

Original Abstract

Proceedings brings the results of investigation in the domain of nanometrology, scanning probe microscopy and related techniques.

Keywords

Nanometrology, nanotechnology, scanning probe microscopy, devices, experiments, results

Authors

TOMÁNEK, P.; SPAJER, M.

RIV year

1994

Released

30. 8. 1994

Publisher

PC-DIR Brno.

Location

Brno

ISBN

80-85895-0

Book

Nanometrology, Scanning Probe Microscopy and Related Techniq

Pages from

1

Pages to

93

Pages count

93

BibTex

@proceedings{BUT64218,
  editor="Pavel {Tománek} and Michel {Spajer}",
  title="Nanometrology, scanning probe microscopy and related techniques",
  year="1994",
  pages="1--93",
  publisher="PC-DIR Brno.",
  address="Brno",
  isbn="80-85895-0"
}