Publication detail

Noise reliability indicators for PN junction devices

HRUŠKA, P.

Original Title

Noise reliability indicators for PN junction devices

Type

conference paper

Language

English

Original Abstract

A measurable quantity Mq, based on the noise of a PN junction microelectronic device, is introduced. Its relation with reliability of the device and furher properties are described.

Keywords

noise, reliability, PN junction

Authors

HRUŠKA, P.

RIV year

2001

Released

15. 11. 2001

Publisher

VUT Brno

Location

Vysoké učení technické v Brně, Fakulta elektrotechniky a informatiky, Ústav fyziky,Brno

ISBN

80-214-1992-X

Book

Nové trendy ve fyzice

Edition number

1

Pages from

80

Pages to

83

Pages count

4

BibTex

@{BUT70565
}