Publication detail

Detection of Backscattered Electrons in Environmental Scaning Electron Microscope

AUTRATA, R., JIRÁK, J., WANDROL, P., ŠPINKA, J.

Original Title

Detection of Backscattered Electrons in Environmental Scaning Electron Microscope

Type

conference paper

Language

English

Original Abstract

Impact of primary electrons causes generation of signals in the environmental scanning electron microscope (ESEM). These signals can be subsequently detected. Secondary and the backscattered electrons are very often used to obtein information about the specimen. In ESEM secondary electrons are mostly detected by a scintillation detector.

Key words in English

backscattered, electron, environmental, scanning, microscope

Authors

AUTRATA, R., JIRÁK, J., WANDROL, P., ŠPINKA, J.

Released

1. 6. 2003

Location

Pula, Croatia

Pages from

489

Pages to

490

Pages count

2

BibTex

@inproceedings{BUT8590,
  author="Rudolf {Autrata} and Josef {Jirák} and Petr {Wandrol} and Jiří {Špinka}",
  title="Detection of Backscattered Electrons in Environmental Scaning Electron Microscope",
  booktitle="Proceedings 6th Multinational Congress on Microscopy",
  year="2003",
  number="1",
  pages="2",
  address="Pula, Croatia"
}