Publication detail

Optimising Solution of the Scan Problem at RT Level Based on a Genetic Algorithm

STRNADEL, J. KOTÁSEK, Z.

Original Title

Optimising Solution of the Scan Problem at RT Level Based on a Genetic Algorithm

Type

article in a collection out of WoS and Scopus

Language

English

Original Abstract

The paper deals with the problem of selecting registers into a scan chain, the problem is solved on RT level. As a result of the methodology, it is not only stated which registers shall be modified into scan registers but also how registers will be organized into sections, namely how registers will be subdivided and ordered in sections. The partial scan problem is defined and seen as a combinatorial problem, a mathematical formula is used to demonstrate it. The problem of selecting registers for scan chain is solved through genetic algorithm. The methodology was implemented and verified on DIFFEQ benchmark circuit. Experimental results are compared with results gained in other approaches.

Keywords

Partial/Full-Scan, Genetic algorithm, Design for testability

Authors

STRNADEL, J.; KOTÁSEK, Z.

RIV year

2002

Released

16. 4. 2002

Publisher

Brno University of Technology

Location

Brno

ISBN

80-214-2094-4

Book

Proceedings of 5th IEEE Design and Diagnostics of Electronics Circuits and Systems Workshop

Pages from

44

Pages to

51

Pages count

8

URL

https://www.fit.vut.cz/research/publication/6897/

BibTex

@inproceedings{BUT9822,
  author="Josef {Strnadel} and Zdeněk {Kotásek}",
  title="Optimising Solution of the Scan Problem at RT Level Based on a Genetic Algorithm",
  booktitle="Proceedings of 5th IEEE Design and Diagnostics of Electronics Circuits and Systems Workshop",
  year="2002",
  pages="44--51",
  publisher="Brno University of Technology",
  address="Brno",
  isbn="80-214-2094-4",
  url="https://www.fit.vut.cz/research/publication/6897/"
}

Documents

2002-ddecs.pdf