Detail publikace

Optimising Solution of the Scan Problem at RT Level Based on a Genetic Algorithm

STRNADEL, J. KOTÁSEK, Z.

Originální název

Optimising Solution of the Scan Problem at RT Level Based on a Genetic Algorithm

Typ

článek ve sborníku mimo WoS a Scopus

Jazyk

angličtina

Originální abstrakt

The paper deals with the problem of selecting registers into a scan chain, the problem is solved on RT level. As a result of the methodology, it is not only stated which registers shall be modified into scan registers but also how registers will be organized into sections, namely how registers will be subdivided and ordered in sections. The partial scan problem is defined and seen as a combinatorial problem, a mathematical formula is used to demonstrate it. The problem of selecting registers for scan chain is solved through genetic algorithm. The methodology was implemented and verified on DIFFEQ benchmark circuit. Experimental results are compared with results gained in other approaches.

Klíčová slova

Partial/Full-Scan, Genetic algorithm, Design for testability

Autoři

STRNADEL, J.; KOTÁSEK, Z.

Rok RIV

2002

Vydáno

16. 4. 2002

Nakladatel

Brno University of Technology

Místo

Brno

ISBN

80-214-2094-4

Kniha

Proceedings of 5th IEEE Design and Diagnostics of Electronics Circuits and Systems Workshop

Strany od

44

Strany do

51

Strany počet

8

URL

https://www.fit.vut.cz/research/publication/6897/

BibTex

@inproceedings{BUT9822,
  author="Josef {Strnadel} and Zdeněk {Kotásek}",
  title="Optimising Solution of the Scan Problem at RT Level Based on a Genetic Algorithm",
  booktitle="Proceedings of 5th IEEE Design and Diagnostics of Electronics Circuits and Systems Workshop",
  year="2002",
  pages="44--51",
  publisher="Brno University of Technology",
  address="Brno",
  isbn="80-214-2094-4",
  url="https://www.fit.vut.cz/research/publication/6897/"
}

Dokumenty

2002-ddecs.pdf