Publication detail

Low Power Testing

KOTÁSEK, Z. ŠKARVADA, J.

Original Title

Low Power Testing

Type

book chapter

Language

English

Original Abstract

Portable computer systems and embedded systems are examples of electronic devices which are powered from batteries, therefore they are designed with the goal of low power consumption. Low power consumption becomes important not only during normal operational mode but during test application as well when switching activity is higher than in normal mode. In this chapter, a survey of basic concepts and methodologies from the area of low power testing is provided. First, it is explained how power consumption is related to switching activities during test application. Then, the concepts of static and dynamic power consumption are discussed together with metrics which can be possibly used to evaluate power consumption.  The survey of methods the goal of which is to reduce dynamic power consumption during test application is then provided followed by a short survey of power-constrained test scheduling methods.

Keywords

power consumption, low power testing

Authors

KOTÁSEK, Z.; ŠKARVADA, J.

RIV year

2012

Released

28. 2. 2012

Publisher

IGI Global

Location

Hershey

ISBN

978-1-60960-212-3

Book

Design and Test Technology foír Dependable Systems-on-Chip

Pages from

395

Pages to

412

Pages count

18

BibTex

@inbook{BUT98565,
  author="Zdeněk {Kotásek} and Jaroslav {Škarvada}",
  title="Low Power Testing",
  booktitle="Design and Test Technology foír Dependable Systems-on-Chip",
  year="2012",
  publisher="IGI Global",
  address="Hershey",
  pages="395--412",
  isbn="978-1-60960-212-3"
}