Detail publikace

Low Power Testing

KOTÁSEK, Z. ŠKARVADA, J.

Originální název

Low Power Testing

Typ

kapitola v knize

Jazyk

angličtina

Originální abstrakt

Portable computer systems and embedded systems are examples of electronic devices which are powered from batteries, therefore they are designed with the goal of low power consumption. Low power consumption becomes important not only during normal operational mode but during test application as well when switching activity is higher than in normal mode. In this chapter, a survey of basic concepts and methodologies from the area of low power testing is provided. First, it is explained how power consumption is related to switching activities during test application. Then, the concepts of static and dynamic power consumption are discussed together with metrics which can be possibly used to evaluate power consumption.  The survey of methods the goal of which is to reduce dynamic power consumption during test application is then provided followed by a short survey of power-constrained test scheduling methods.

Klíčová slova

power consumption, low power testing

Autoři

KOTÁSEK, Z.; ŠKARVADA, J.

Rok RIV

2012

Vydáno

28. 2. 2012

Nakladatel

IGI Global

Místo

Hershey

ISBN

978-1-60960-212-3

Kniha

Design and Test Technology foír Dependable Systems-on-Chip

Strany od

395

Strany do

412

Strany počet

18

BibTex

@inbook{BUT98565,
  author="Zdeněk {Kotásek} and Jaroslav {Škarvada}",
  title="Low Power Testing",
  booktitle="Design and Test Technology foír Dependable Systems-on-Chip",
  year="2012",
  publisher="IGI Global",
  address="Hershey",
  pages="395--412",
  isbn="978-1-60960-212-3"
}