Publication detail

Microscale localization and detection of defects in crystalline silicon solar cells

TOMÁNEK, P. ŠKARVADA, P. MACKŮ, R. SOBOLA, D. BRÜSTLOVÁ, J. GRMELA, L.

Original Title

Microscale localization and detection of defects in crystalline silicon solar cells

Type

journal article - other

Language

English

Original Abstract

Silicon remains the only material that is well-researched in both bulk and thin-film configurations. Monocrystalline silicon solar cells are the photovoltaic devices with highest efficiency, but they content a variety of tiny local defects decreasing the efficiency. So the novel method containing electric and optical measurement is presented.

Keywords

defect, silicon, solar cell, localization, detection

Authors

TOMÁNEK, P.; ŠKARVADA, P.; MACKŮ, R.; SOBOLA, D.; BRÜSTLOVÁ, J.; GRMELA, L.

RIV year

2015

Released

17. 8. 2015

Publisher

DGaO

Location

Erlangen, Německo

ISBN

1614-8436

Periodical

DGaO-PROCEEDINGS

Year of study

2015

Number

2015

State

Federal Republic of Germany

Pages from

1

Pages to

2

Pages count

2

URL

http://www.dgao-proceedings.de

BibTex

@article{BUT116796,
  author="Pavel {Tománek} and Pavel {Škarvada} and Robert {Macků} and Dinara {Sobola} and Jitka {Brüstlová} and Lubomír {Grmela}",
  title="Microscale localization and detection of defects in crystalline silicon solar cells",
  journal="DGaO-PROCEEDINGS",
  year="2015",
  volume="2015",
  number="2015",
  pages="1--2",
  issn="1614-8436",
  url="http://www.dgao-proceedings.de"
}