Publication detail

Burst noise with normal distribution of characteristic times in sub-micron ultra-thin-oxide MOSFET´s

HRUŠKA, P., KOLÁŘOVÁ, R., ŠIKULA, J.

Original Title

Burst noise with normal distribution of characteristic times in sub-micron ultra-thin-oxide MOSFET´s

Type

conference paper

Language

English

Original Abstract

Statistical tests of the pulses have shown normal distribution rather than the Poisson one which expected.

Key words in English

burst noise, sub-micro MOSFET

Authors

HRUŠKA, P., KOLÁŘOVÁ, R., ŠIKULA, J.

Released

14. 5. 2000

Publisher

IEEE

Location

Niš

ISBN

0-7803-5235-1

Book

Proceedings of 22nd International conference on microelectronics

Pages from

387

Pages to

389

Pages count

3

BibTex

@inproceedings{BUT12700,
  author="Pavel {Hruška} and Renata {Horová} and Josef {Šikula}",
  title="Burst noise with normal distribution of characteristic times in sub-micron ultra-thin-oxide MOSFET´s",
  booktitle="Proceedings of 22nd International conference on microelectronics",
  year="2000",
  pages="3",
  publisher="IEEE",
  address="Niš",
  isbn="0-7803-5235-1"
}