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ALLAHAM, M. BURDA, D. MOUSA, M. KNÁPEK, A. AlJrawen S.Y. AlSa’eed M. H.
Original Title
Analyses of field electron emission Molybdenum current-voltage data using Fowler-Nordheim and Murphy-Good plots
Type
conference paper
Language
English
Original Abstract
Field electron emission theory and experiments include testing and analyzing the measured current-voltage characteristics using the so-called Fowler-Nordheim or Murphy-Good plots. Although Fowler-Nordheim plots are theoretically predicted to be slightly curved and Murphy-Good plots are predicted to be almost-exactly straight, still they provide the same results when applying the field-emission orthodoxy test to practical experimental data, and near results when extracting the emitter characterization parameters. This study is to compare the analysis results that will be obtained when applying the two methods to experimental data obtained from Molybdenum single field emitters, mounted in a traditional field emission microscope, and operated in high vacuum conditions (~10 -6 Pa).
Keywords
Geometry; Shape; Surface contamination; Ions; Iron; Electron emission; Molybdenum
Authors
ALLAHAM, M.; BURDA, D.; MOUSA, M.; KNÁPEK, A.; AlJrawen S.Y.; AlSa’eed M. H.
Released
17. 11. 2021
Publisher
2021 34th International Vacuum Nanoelectronics Conference (IVNC)
Location
Lyon, France
ISBN
978-1-6654-2589-6
Book
2380-6311
Periodical
State
United States of America
Pages from
151
Pages to
152
Pages count
2
URL
https://ieeexplore.ieee.org/document/9600771
BibTex
@inproceedings{BUT175014, author="Mohammad Mahmoud {Allaham} and Marwan {Mousa} and Daniel {Burda} and Mohammad H. {AlSa'eed} and Sabreen Y. {AlJrawen} and Alexandr {Knápek}", title="Analyses of field electron emission Molybdenum current-voltage data using Fowler-Nordheim and Murphy-Good plots", booktitle="2021 34th International Vacuum Nanoelectronics Conference (IVNC)", year="2021", journal="2021 34th International Vacuum Nanoelectronics Conference (IVNC)", pages="151--152", publisher="2021 34th International Vacuum Nanoelectronics Conference (IVNC)", address="Lyon, France", doi="10.1109/IVNC52431.2021.9600771", isbn="978-1-6654-2589-6", issn="2380-6311", url="https://ieeexplore.ieee.org/document/9600771" }