Publication detail

Analyses of field electron emission Molybdenum current-voltage data using Fowler-Nordheim and Murphy-Good plots

ALLAHAM, M. BURDA, D. MOUSA, M. KNÁPEK, A. AlJrawen S.Y. AlSa’eed M. H.

Original Title

Analyses of field electron emission Molybdenum current-voltage data using Fowler-Nordheim and Murphy-Good plots

Type

conference paper

Language

English

Original Abstract

Field electron emission theory and experiments include testing and analyzing the measured current-voltage characteristics using the so-called Fowler-Nordheim or Murphy-Good plots. Although Fowler-Nordheim plots are theoretically predicted to be slightly curved and Murphy-Good plots are predicted to be almost-exactly straight, still they provide the same results when applying the field-emission orthodoxy test to practical experimental data, and near results when extracting the emitter characterization parameters. This study is to compare the analysis results that will be obtained when applying the two methods to experimental data obtained from Molybdenum single field emitters, mounted in a traditional field emission microscope, and operated in high vacuum conditions (~10 -6 Pa).

Keywords

Geometry; Shape; Surface contamination; Ions; Iron; Electron emission; Molybdenum

Authors

ALLAHAM, M.; BURDA, D.; MOUSA, M.; KNÁPEK, A.; AlJrawen S.Y.; AlSa’eed M. H.

Released

17. 11. 2021

Publisher

2021 34th International Vacuum Nanoelectronics Conference (IVNC)

Location

Lyon, France

ISBN

978-1-6654-2589-6

Book

2021 34th International Vacuum Nanoelectronics Conference (IVNC)

ISBN

2380-6311

Periodical

2021 34th International Vacuum Nanoelectronics Conference (IVNC)

State

United States of America

Pages from

151

Pages to

152

Pages count

2

URL

BibTex

@inproceedings{BUT175014,
  author="Mohammad Mahmoud {Allaham} and Marwan {Mousa} and Daniel {Burda} and Mohammad H. {AlSa'eed} and Sabreen Y. {AlJrawen} and Alexandr {Knápek}",
  title="Analyses of field electron emission Molybdenum current-voltage data using Fowler-Nordheim and Murphy-Good plots",
  booktitle="2021 34th International Vacuum Nanoelectronics Conference (IVNC)",
  year="2021",
  journal="2021 34th International Vacuum Nanoelectronics Conference (IVNC)",
  pages="151--152",
  publisher="2021 34th International Vacuum Nanoelectronics Conference (IVNC)",
  address="Lyon, France",
  doi="10.1109/IVNC52431.2021.9600771",
  isbn="978-1-6654-2589-6",
  issn="2380-6311",
  url="https://ieeexplore.ieee.org/document/9600771"
}