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KLAPETEK, P. NEČAS, D. HEAPS, E. SAUVET, B. KLAPETEK, V. VALTR, M. KORPELAINEN, V. YACOOT, A.
Original Title
Stitching accuracy in large area scanning probe microscopy
Type
journal article in Web of Science
Language
English
Original Abstract
Image stitching is a technique that can significantly enlarge the scan area of scanning probe microscope (SPM) images. It is also the most commonly used method to cover large areas in high-speed SPM. In this paper, we provide details on stitching algorithms developed specifically to mitigate the effects of SPM error sources, namely the presence of scanner non-flatness. Using both synthetic data and flat samples we analyse the potential uncertainty contributions related to stitching, showing that the drift and line mismatch are the dominant sources of uncertainty. We also present the 'flatten base' algorithm that can significantly improve the stitched data results, at the cost of losing the large area form information about the sample.
Keywords
SPM; stitching; uncertainty; data processing
Authors
KLAPETEK, P.; NEČAS, D.; HEAPS, E.; SAUVET, B.; KLAPETEK, V.; VALTR, M.; KORPELAINEN, V.; YACOOT, A.
Released
4. 10. 2024
Publisher
IOP Publishing Ltd
Location
BRISTOL
ISBN
1361-6501
Periodical
Measurement Science and Technology
Year of study
35
Number
12
State
United Kingdom of Great Britain and Northern Ireland
Pages from
125026
Pages to
125037
Pages count
URL
https://iopscience.iop.org/article/10.1088/1361-6501/ad7a13
BibTex
@article{BUT193388, author="Petr {Klapetek} and David {Nečas} and Edward {Heaps} and Bruno {Sauvet} and Vojtěch {Klapetek} and Miroslav {Valtr} and Virpi {Korpelainen} and Andrew {Yacoot}", title="Stitching accuracy in large area scanning probe microscopy", journal="Measurement Science and Technology", year="2024", volume="35", number="12", pages="125026--125037", doi="10.1088/1361-6501/ad7a13", issn="1361-6501", url="https://iopscience.iop.org/article/10.1088/1361-6501/ad7a13" }