Testing of solar cells using fast transients.

conference paper

English

Characterization of solar cells based on evaluation of solar cell response to fast transients is described. The parameters as the reverse breakdown voltage, depletion layer width and capacitance, serial and parallel resistance and minority carrier lifetime can be acquired easily. The measurement and evaluation procedure is very simple and no expensive devices are needed, but there are two problems which must be always considered. Firstly the recombination time depends on the actual concentration of minority carriers and also trapping effects can superimpose to the minority carriers concentration decay. Other problem is influence of cell junction parameters, especially the depletion layer capacitance, which masks the recombination phenomena. To cancel the influence of the depletion layer capacitance a voltage bias in the range 400 – 500 mV was used. The voltage bias was made with dark current bias or with light bias. The measurement and evaluation scheme is given and some parameters of different quality solar cells are discussed.

solar cells, reverse breakdown voltage, minority carrier lifetime, recombination, diffusion capacitance

J.Boušek

2005

14. 9. 2005

Nakl. Novotný

Brno

80-214-2990-9

Electronic Devices and Systems 2005. Proceedings

194

199

6