Přístupnostní navigace
E-application
Search Search Close
Publication detail
Ondřej Hégr, Jaroslav Boušek
Original Title
Minority carriers lifetime in Si PV cells with sputtered passivation
Type
conference paper
Language
English
Original Abstract
Thin layers of silicon nitride are routinely used as passivation layers for solar cells. For deposition of SiNx films the main advantage of magnetron sputtering technology is low process temperature. The amount of the crystal lattice deffect decrease when using this low-temperature process. For determination of recombination parameters we used microwave-detected photo-conductance decay (MW-PCD). The aim of work was evaluation of both front and back side surface recombinations and optical properties of sputtered layers and their comparison with passivatinon layers on standard solar cells made by company Solartec (Czech republic).
Keywords
passivation layers, silicon nitride, magnetron sputtering, MW-PCD, lifetime
Authors
Released
1. 1. 2006
Publisher
nakl. Z. Novotný
ISBN
960-8025-99-8
Book
Socrates workshop 2006
Pages from
177
Pages to
182
Pages count
6
BibTex
@inproceedings{BUT24711, author="Ondřej {Hégr} and Jaroslav {Boušek} and Jaroslav {Sobota} and Radim {Bařinka} and Aleš {Poruba}", title="Minority carriers lifetime in Si PV cells with sputtered passivation", booktitle="Socrates workshop 2006", year="2006", volume="2006", number="1", pages="6", publisher="nakl. Z. Novotný", isbn="960-8025-99-8" }