Publication detail

Passivation quality test by noise method

VANĚK, J. KAZELLE, J. CHOBOLA, Z. JURÁNKOVÁ, V.

Original Title

Passivation quality test by noise method

Type

conference paper

Language

English

Original Abstract

Transport and noise characteristic of forward biased monocrystalline silicon solar cells made by different passivation method were measured in order to evaluate new technology:

Keywords

noise characteristic

Authors

VANĚK, J.; KAZELLE, J.; CHOBOLA, Z.; JURÁNKOVÁ, V.

RIV year

2006

Released

14. 9. 2006

Publisher

Ing.Zdeněk Novotný,CSc.

Location

Brno

ISBN

80-214-3246-2

Book

Electronic Devices and Systems

Pages from

175

Pages to

178

Pages count

4

BibTex

@inproceedings{BUT25071,
  author="Jiří {Vaněk} and Jiří {Kazelle} and Zdeněk {Chobola} and Vlasta {Juránková}",
  title="Passivation quality test by noise method",
  booktitle="Electronic Devices and Systems",
  year="2006",
  pages="175--178",
  publisher="Ing.Zdeněk Novotný,CSc.",
  address="Brno",
  isbn="80-214-3246-2"
}