Publication detail

Investigation of a possible correlation between current noise and long-term stability of thick-film resistors

BELAVIČ, D. ROČAK, D. ŠIKULA, J. HROVAT, M. KOKTAVÝ, B. PAVELKA, J.

Original Title

Investigation of a possible correlation between current noise and long-term stability of thick-film resistors

Type

conference paper

Language

English

Original Abstract

In this paper possible correlation between current noise and long-term stability of thick-film resistors was investigated. .

Keywords

noise

Authors

BELAVIČ, D.; ROČAK, D.; ŠIKULA, J.; HROVAT, M.; KOKTAVÝ, B.; PAVELKA, J.

Released

22. 6. 2000

Publisher

IMAPS

Location

Praha

ISBN

80-238-5509-3

Book

Proc. European Microelectronics, Packaging and Interconnection Symposium

Pages from

464

Pages to

469

Pages count

6

BibTex

@inproceedings{BUT30974,
  author="Darko {Belavič} and Dubravka {Ročak} and Josef {Šikula} and Marko {Hrovat} and Bohumil {Koktavý} and Jan {Pavelka}",
  title="Investigation of a possible correlation between current noise and long-term stability of thick-film resistors",
  booktitle="Proc. European Microelectronics, Packaging and Interconnection Symposium",
  year="2000",
  pages="6",
  publisher="IMAPS",
  address="Praha",
  isbn="80-238-5509-3"
}