Publication detail

Calculation of sensitivities in two-dimmensional electrical impedance tomography

VALSA, J., DĚDKOVÁ, J., DĚDEK, L.

Original Title

Calculation of sensitivities in two-dimmensional electrical impedance tomography

Type

conference paper

Language

English

Original Abstract

Electrical impedance tomography is used to locate non-homogenities in otherwise homogenous media. The volume to be analyzed is accessible only in limited number of external nodes. Some of these nodes can be supplied from external current source while the others carry potentials that reflect the content of the volume. The present paper shows how the potentials vary with position of non-homogenous elements inside and with the chosen application of testing signal. Resultant sensitivities can be used for calculation of gradients in the optimization process.

Keywords

Electrical impedance tomography, sensitivity, finite element method

Authors

VALSA, J., DĚDKOVÁ, J., DĚDEK, L.

RIV year

2003

Released

1. 5. 2003

Publisher

Silesian University of Technology

Location

Gliwice

ISBN

83-85940-25-1

Book

26th International conference of fundamentals of electrotechnics and circuit theory IC - SPETO 2003

Pages from

43

Pages to

45

Pages count

3

BibTex

@inproceedings{BUT8442,
  author="Juraj {Valsa} and Jarmila {Dědková} and Libor {Dědek}",
  title="Calculation of sensitivities in two-dimmensional electrical impedance tomography",
  booktitle="26th International conference of fundamentals of electrotechnics and circuit theory IC - SPETO 2003",
  year="2003",
  pages="3",
  publisher="Silesian University of Technology",
  address="Gliwice",
  isbn="83-85940-25-1"
}