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Course detail
FSI-TCOAcad. year: 2011/2012
The course deals with problems of optics of charged particles in focusing and deflection systems and spectrometers. The sources of electrons and ions are characterized as well as electron and ion optical elements and instruments utilizing the beams of charged particles.
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Offered to foreign students
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Specification of controlled education, way of implementation and compensation for absences
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Classification of course in study plans
branch M-PMO , 2 year of study, winter semester, compulsorybranch M-FIN , 2 year of study, winter semester, compulsory
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