Course detail

Microscopy and Spectroscopy

FSI-TMKAcad. year: 2012/2013

Classical and modern light microscopy, confocal microscopy, fluorescence microscopy, Raman microspectroscopy, interference and holographic microscopy, computers and cameras in microscopy, Raman spectroscopy, optical spectroscopy, XPS, SIMS, LEIS.

Language of instruction

Czech

Number of ECTS credits

5

Mode of study

Not applicable.

Guarantor

prof. RNDr. Radim Chmelík, Ph.D.

Department

Institute of Physical Engineering (ÚFI)

Learning outcomes of the course unit

Students will learn about the history and modern techniques and approaches in the field of light microscopy and spectroscopies (light and particle) and fundamental practical experience with relevant devices. Among others, it help them to select their own topic (for diplomma or doctoral thesis).

Prerequisites

Elementary Physics, Quantum Physics, Solid State Physics, Surfaces and Thin Films. Geometrical and wave optics.

Co-requisites

Not applicable.

Planned learning activities and teaching methods

Teaching methods depend on the type of course unit as specified in the article 7 of BUT Rules for Studies and Examinations.

Assesment methods and criteria linked to learning outcomes

The assessment of a student is made upon his performance in written and oral part of the exam.

Course curriculum

Not applicable.

Work placements

Not applicable.

Aims

The goal of the course is to provide students an overview of the principle and methods of light microscopy and spectroscopy, and of particle spectroscopy and give them practical experience with relevant devices.

Specification of controlled education, way of implementation and compensation for absences

The presence of students is monitored by the tutor. Maximum of tolerated absence is 25 %.

Recommended optional programme components

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

C. Kittel: Úvod do fyziky pevných látek 1997.
R. Waser (Ed.) Nanoelectronics and Information Technology 2005.
Kasap, Capper (Ed.) Springer Handbook of Electronic and Photonic Materials 2006.
A. Beninghoven: Secondary Ion Mass Spectrometry - basics concepts, instrumental aspects, applications and trends, John Wiley & Sons, NY, volume 86, 1987.
J. F. Ziegler, J. P. Biersack, M.D. Ziegler: SRIM The Stopping and Range of Ions in Matter, SRIM Co., 2008.
R. G. Wilson, F. A. Stevie, and C. W. Magee: Secondary Ion Mass Spectrometry - a practical handbook for depth profiling and bulk analysis, John Wiley, 1989.
W. Eckstain: Computer Simulation of Ion-Solid Interaction, Springer-Verlag, 1991.
D. B. Murphy, M.W. Davidson: Fundamentals of light microscopy and electronic imaging. Wiley‐Blackwell 2012. (EN)
A. R. Hibbs: Confocal Microscopy for Biologists. Springer, 2004.

Recommended literature

Not applicable.

Classification of course in study plans

  • Programme N3901-2 Master's

    branch M-FIN , 2 year of study, winter semester, compulsory
    branch M-PMO , 2 year of study, winter semester, compulsory

Type of course unit

 

Lecture

26 hod., optionally

Teacher / Lecturer

doc. Ing. Stanislav Průša, Ph.D.
doc. Ing. Petr Bábor, Ph.D.
Ing. Zbyněk Dostál, Ph.D.
Ing. Jana Čolláková
prof. RNDr. Radim Chmelík, Ph.D.
Ing. Martin Antoš, Ph.D.

Syllabus

Fundamentals of light microscopy
Theoretical description of imaging
Confocal microscopy
Fluorescence microscopy
Raman microscpectroscopy & optical micromanipulations
Computers & cameras in microscopy
Optical & Raman spectroscopy
XPS
SIMS
LEIS