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Course detail
FEKT-MDMEAcad. year: 2019/2020
Organization of testing in Czech Rep. and EU. Diagnostic methods for evaluation of properties and parameters of electroinsulating materials and systems. Microscopic, spectroscopic and difractometric diagnostic methods, physical principles and their use. Diagnostic methods for evaluation of properties of semiconductor wafers and structures, of contamination and defects in semiconductor materials. Theory of evaluation of measured data.
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Specification of controlled education, way of implementation and compensation for absences
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Classification of course in study plans
branch M-EVM , 2 year of study, winter semester, compulsory
branch EE-FLE , 1 year of study, winter semester, compulsory
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