Course detail

Theory of Measurements, Measurement Techniques and Technical Diagnostics

FSI-9TTDAcad. year: 2022/2023

The course introduces students to the theory of advanced measurement techniques and measuring systems with nanometer resolution.

Language of instruction

Czech

Mode of study

Not applicable.

Guarantor

doc. Ing. Stanislav Průša, Ph.D.

Department

Institute of Physical Engineering (ÚFI)

Learning outcomes of the course unit

Understanding of selected physical principles and their application in measurements, sensors and equipments.

Prerequisites

Successful completion of the course is conditional on the knowledge and skills acquired in the courses "Physics I", "Physics II", "Metrological Physics".

Co-requisites

Not applicable.

Planned learning activities and teaching methods

The course is taught through lectures explaining the basic principles and theory of the discipline.

Assesment methods and criteria linked to learning outcomes

An examination composed from oral and written part.

Course curriculum

Not applicable.

Work placements

Not applicable.

Aims

Describe physical principles of selected measuring methods and measuring equipments.

Specification of controlled education, way of implementation and compensation for absences

Participation at every course parts.

Recommended optional programme components

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

BOX, G.E.P., HUNTER, W.G., HUNTER, J.S. Statistics for Experiments-an Introduction to Design, Data Analysis and Model Building, Wiley 1978 (EN)
DOEBELIN, O.D.: Measurement Systems. Application and Design.. New York: McGraw-Hill, 1990. (EN)
Normy: Mezinárodní slovník základních a všeobecných termínů v metrologii.. ČSN 01 0115
ORNATSKIJ, P.P.: Teoretičeskije osnovy informacionno-izměritělnoj techniki. Kijev: Vyšča škola, 1976.
REIMER, L, Scanning Electron Microscopy (2nd ed.), Springer,1998 (EN)
RIPKA, P.; TIPEK, A. Master Book of Sensors, part A, part B, Czech Technical University, 2003 (EN)
WIESENDAGER. R., GUNTHERODT. J.H.: Scanning Tuneling Microscopy II, Springer 1995 (EN)
WILIAMS, D. B., CARTER, C. B. Transmission Electron Microscopy (2nd ed.), Springer, 2009 (EN)

Recommended reading

DOEBELIN, O.D.: Measurement Systems. Application and Design.. New York: McGraw-Hill, 1990. (EN)
JENČÍK, J., KUHN, L. a další: Technická měření ve strojírenství.. Praha: SNTL, 1982.
Normy: Vyjadřování nejistoty při měření.

Classification of course in study plans

  • Programme D-APM-K Doctoral 1 year of study, winter semester, recommended course
  • Programme D-APM-P Doctoral 1 year of study, winter semester, recommended course

Type of course unit

 

Lecture

20 hod., optionally

Teacher / Lecturer

doc. Ing. Stanislav Průša, Ph.D.

Syllabus

General definitions and theory. Statistics and data processing: classification of random parameters (Gaussian and uniform distribution). Law of error propagation. Experimental data processing.

Sensors: general classification, capacity sensors, sensors based on induction.

Advanced methods of visualisation and diagnostics: scanning electron microscopy, atomic force microscopy, scanning tunnelling microscopy.