Course detail

Introduction to electron microscopy and microanalysis

CEITEC VUT-DS131Acad. year: 2024/2025

The course aims at providing overview of the techniques of electron microscopy and related analytical techniques that are widely used in materials research. Namely, scanning- and transmission electron microscopies, energy- and wave dispersive spectroscopies, electron backscatter diffraction and electron energy loss spectroscopy will be introduced. Attention will be paid to working principle, the instrumentation and limitations of each method.

The objective is to provide a wide enough pool of knowledge so the students are able to choose the appropriate method for their research.

 

Language of instruction

Czech

Mode of study

Not applicable.

Guarantor

Ing. Ondřej Man, Ph.D.

Department

Central European Institute of Technology BUT (CEITEC VUT)

Entry knowledge

The requirements on previous knowledge is: basic physics (mechanics, electricity, magnetism and quantum theory) and mathematics (differential, integral and matrix calculus, statistics) as provided during BSc/MSc studies. Further, knowledge on solid matter physics and crystallography is a benefit.

 

Rules for evaluation and completion of the course

Students’ knowledge is evaluated through consultation, subject final is in the form of doctoral exam.

 

Aims

Not applicable.

Study aids

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

Goldstein, J. Scanning electron microscopy and X-ray microanalysis. edited by D.E. Newbury, J.R. Michael, N.W.M. Ritchie, et al.Fourth edition ed. New York: New York : Springer, 2018. ISBN 978-1-4939-6674-5. (CS)
Reimer, L. Scanning electron microscopy: physics of image formation and microanalysis. Berlin, Heidelberg, New York, Tokyo: Springer-Verlag, 1985. 457 p. ISBN 0387135308. (CS)
Williams, D. B. AND C. B. Carter. Transmission Electron Microscopy [online]. second. [Boston, MA]: Springer US, 2009. Available from World Wide Web:https://doi.org/10.1007/978-0-387-76501-3_1 (CS)

Recommended reading

Not applicable.