Course detail

Diagnostics and testing of electronic systems

FEKT-BDTSAcad. year: 2010/2011

Diagnostics and testing of electronic circuits. Failures classification and failure mechanisms. Physical and functional methods of technical diagnostics. Diagnostics system. The types of failures. Failures detection and localization. Diagnostics of logic and analogue circuits. Structural tests generation. Test equipments. Boundary scan, ASA testers, signature analyzers, logic analyzers. Design for testability and diagnostics. Diagnostics of microprocessors and microcomputers.

Language of instruction

Czech

Number of ECTS credits

5

Mode of study

Not applicable.

Guarantor

prof. Ing. Vladislav Musil, CSc.

Department

Department of Microelectronics (UMEL)

Learning outcomes of the course unit

To understand the principles of physical and functional diagnostics methods. To get practical knowledge of functional diagnostics methods. A simple tests generation of analog and digital circuits.

Prerequisites

The subject knowledge on the secondary school level is required.

Co-requisites

Not applicable.

Planned learning activities and teaching methods

Teaching methods depend on the type of course unit as specified in the article 7 of BUT Rules for Studies and Examinations.

Assesment methods and criteria linked to learning outcomes

written test ... 30 points
final test ... 70 points

Course curriculum

Structure and basics of the subject.
Diagnostics system. On-line and off-line diagnostics.
Types of failures, failures mechanisms. Failures of passive and active elements of electronic circuits. Failures of integrated circuits. CMOS circuits failures.
Physical and function methods of technical diagnostics. Mathematical models of diagnostics objects. Diagnostics tests and forms of diagnostics. Tests generation.
The functional diagnostics methods application on the objects with analog variables.
Diagnostics and testing of digital circuits. Structural test generation. Functional tests. Test pattern generation of the circuits described by high level language.
Automatic test pattern generation. Test pattern optimisation and compression of diagnostics data. Signature analysis.
Desgn for diagnostics. Structural design. Built-in diagnostics means.
Diagnostics and testing of digital integrated circuits. Testing of microprocessors and microcomputers.
Diagnostics and testing of analog circuits. Diagnostics and testing of analog and mixed integrated circuits. CMOS analog IC testing.
Test equipments of electronic systems. Test equipments of integrated circuits. Test equipments of elecctronic boards. In-circuit testers. Boundary-scan testers and analyzers. ASA Tester.
Signature analyzers and their arrangement. Signature analysis diagnosis methods. Signature analysis of microprocessors systems.
Logic analyzers. State and time analysis. Triggering. Selective tracing. Results viewing. Using logic analyzer in microprocessors systems. Up to date logic analyzers parameters.

Work placements

Not applicable.

Aims

Make students acquainted with electronic systems diagnostics methods.

Specification of controlled education, way of implementation and compensation for absences

computer exercises

Recommended optional programme components

Not applicable.

Prerequisites and corequisites

Not applicable.

Basic literature

Bushnell M.L., Agrawal V. D.: Essentials of Electronic Testing, Kluwer Academic Publishers, Boston, 2000 (EN)
Hurst L.S.: VLSI testing, The Institution of EE, London, 1998 (EN)
Mourad S.: Principles of Testing Electronic Systems, John Wiley & Sons Inc., New York, 2000 (EN)

Recommended reading

Kwok K.N.: Complete Guide To Semiconductor Devices, Mc Graw-Hill Inc., 1995 (EN)
Uyemura J.P.: Introduction to VLSI Circuits and Systems, John Wiley & Sons, 2002 (EN)

Classification of course in study plans

  • Programme EECC Bc. Bachelor's

    branch B-EST , 2 year of study, summer semester, elective interdisciplinary
    branch B-MET , 2 year of study, summer semester, elective specialised

  • Programme EEKR-CZV lifelong learning

    branch EE-FLE , 1 year of study, summer semester, elective specialised

Type of course unit

 

Lecture

26 hod., optionally

Teacher / Lecturer

Ing. Michal Pavlík, Ph.D.

Syllabus

Structure and basics of the subject.
Diagnostics system. On-line and off-line diagnostics.
Types of failures, failures mechanisms. Failures of passive and active elements of electronic circuits. Failures of integrated circuits. CMOS circuits failures.
Physical and function methods of technical diagnostics. Mathematical models of diagnostics objects. Diagnostics tests and forms of diagnostics. Tests generation.
The functional diagnostics methods application on the objects with analog variables.
Diagnostics and testing of digital circuits. Structural test generation. Functional tests. Test pattern generation of the circuits described by high level language.
Automatic test pattern generation. Test pattern optimisation and compression of diagnostics data. Signature analysis.
Desgn for diagnostics. Structural design. Built-in diagnostics means.
Diagnostics and testing of digital integrated circuits. Testing of microprocessors and microcomputers.
Diagnostics and testing of analog circuits. Diagnostics and testing of analog and mixed integrated circuits. CMOS analog IC testing.
Test equipments of electronic systems. Test equipments of integrated circuits. Test equipments of elecctronic boards. In-circuit testers. Boundary-scan testers and analyzers. ASA Tester.
Signature analyzers and their arrangement. Signature analysis diagnosis methods. Signature analysis of microprocessors systems.
Logic analyzers. State and time analysis. Triggering. Selective tracing. Results viewing. Using logic analyzer in microprocessors systems. Up to date logic analyzers parameters.

Exercise in computer lab

26 hod., optionally

Teacher / Lecturer

Ing. Michal Pavlík, Ph.D.
doc. Ing. Vilém Kledrowetz, Ph.D.

Syllabus

Fault modeling and simulation of digital circuits.
Test pattern generation.
Fault modeling and simulation of analog circuits.
CMOS defects modeling.
Diagnostics of standard CMOS logic cells.
Diagnostics of standard CMOS analog cells.