Cílem projektu je navržení a sestavení zařízení FIB-SEM s vysunovatelným pixeloveným detektorem vhodným k analýze 4D-STEM a odladění kompletního pracovního postupu od vyřezání lamely po její 4D-STEM analýzu bez nutnosti expozice lamely atmosféře.

Popis anglicky
The project aims to design and build a FIB-SEM device with a retractable pixellated detector suitable for 4D STEM analysis along with a complete workflow from millin a lamella to 4D STEM analysis without exposing the sample to the atmosphere. The project further aims to integrate the said detector by synchronizing it with microscope scanning and adding the cumulative signal as a new detector for live scanning. It will be possible to set up the detector and start 4D STEM mapping from within the microscope software. Secondary goals of the project will be "Prototype detector for 4D STEM" and "Software for pixel data conversion and image interpretation," for use/applications outside the FIB-SEM 4D STEM domain.

Klíčová slova
4D STEM; FIB-SEM system; electron diffraction; pixellated detector; Timepix3;

Klíčová slova anglicky
4D STEM, FIB-SEM system, electron diffraction, pixellated detector, Timepix3