Detail publikace

Dielectric Properties of Niobium Oxide Film and Tantalum Oxide Film at Electrolytic Niobium And Tantalum Capacitors

ABUETWIRAT, I. PALAI-DANY, T.

Originální název

Dielectric Properties of Niobium Oxide Film and Tantalum Oxide Film at Electrolytic Niobium And Tantalum Capacitors

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Complex permittivity of the niobium oxide capacitor 4.7 micro-F/ 10 Vdc and tantalum oxide 1 micro-F/ 25 Vdc was measured at room temperature at frequencies from 20 Hz to 2 MHz using the HP (Agilent) E4980A impedance analyzer, with Agilent 16034E 2-terminal test fixture for surface mounted devices (SMD). The real part of the complex permittivity for the niobium oxide capacitor at room temperature is 50 at 20Hz with one dielectric relaxation peak, which was observed at about 10 kHz. Whereas the real part of the complex permittivity for tantalum oxide capacitor at room temperature is 27 at 20Hz with one dielectric relaxation peak, which was observed at about 100 kHz. It has been shown that to be useful to use niobium and tantalum oxide capacitor below 100 kHz for measuring the dielectric properties of niobium and tantalum oxide film.

Klíčová slova

Real part of complex permittivity, imaginary part of complex permittivity, loss factor, conductivity.

Autoři

ABUETWIRAT, I.; PALAI-DANY, T.

Rok RIV

2012

Vydáno

21. 5. 2012

Nakladatel

FEKT VUT Brno

Místo

Žilina, Slovak Republic

ISBN

978-1-4673-1178-6

Kniha

9th ELEKTRO 2012 international conference

Edice

1

Číslo edice

1

Strany od

484

Strany do

488

Strany počet

5

BibTex

@inproceedings{BUT100594,
  author="Inas Faisel {Abuetwirat} and Tomáš {Palai-Dany}",
  title="Dielectric Properties of Niobium Oxide Film and Tantalum Oxide Film at Electrolytic Niobium And Tantalum Capacitors",
  booktitle="9th ELEKTRO 2012 international conference",
  year="2012",
  series="1",
  number="1",
  pages="484--488",
  publisher="FEKT VUT Brno",
  address="Žilina, Slovak Republic",
  isbn="978-1-4673-1178-6"
}