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CHOBOLA, Z. LUŇÁK, M. VANĚK, J. BAŘINKA, R.
Originální název
Low-frequency noise, microplasma, and electroluminescence measurements as faster tools to investigate quality of monocrystalline-silicon solar cells
Typ
článek v časopise ve Web of Science, Jimp
Jazyk
angličtina
Originální abstrakt
Two sets of c-Si solar cells varying in front side phosphorus doped emitters were produced by standard screen printing techniques. The first group of samples, 3121, was prepared by a combination of standard washing and a bath with a highly dilute HF before diffusion of n(+)-emitter. The second group of samples, 3122, was treated only with standard washing. A comparison of solar cell conversion efficiency and results from a noise spectroscopy, microplasma, and electroluminescence presence are presented. As was already shown in previous publications noise spectral density reflects the quality of solar cells, and thus represents an alternative advanced cell diagnostic tool. Our results confirm this relationship and moreover bring clear evidence for the maximum spectral noise voltage density being related to the emitter structure. The best results were reached for the group of solar cells in sample 3122, which was treated only with standard washing. (C) 2013 Society of Photo-Optical Instrumentation Engineers (SPIE).
Klíčová slova
solar cell; monocrystalline-silicon; noise; microplasma; electrolumi-nescence; quality; indicator; efficiency
Autoři
CHOBOLA, Z.; LUŇÁK, M.; VANĚK, J.; BAŘINKA, R.
Rok RIV
2013
Vydáno
4. 3. 2013
Nakladatel
SPIE
Místo
Spojené státy americké
ISSN
0091-3286
Periodikum
Optical Engineering
Ročník
52
Číslo
5
Stát
Strany od
051203-1
Strany do
051203-6
Strany počet
6