Detail publikace

Normalized Testability Measures Based on RTL Digital Circuit Graph Model Analysis

STRNADEL, J.

Originální název

Normalized Testability Measures Based on RTL Digital Circuit Graph Model Analysis

Typ

článek ve sborníku mimo WoS a Scopus

Jazyk

angličtina

Originální abstrakt

The paper presents measures for testability valuation of a digital circuit at register-transfer level (RT level, RTL). Definition of a graph model of a RTL digital circuit for these purposes and mathematical formulas of measures for testability valuation based on analysis of proposed graph model are presented in this paper. Finally, experimental results are presented.

Klíčová slova

Register transfer level, digital circuit graph model, testability analysis measures

Autoři

STRNADEL, J.

Vydáno

1. 9. 2002

Nakladatel

The University of Technology Košice

Místo

Košice

ISBN

80-7099-879-2

Kniha

Proceedings of The fifth International Scientific Conference Electronic Computers and Informatics 2002

Edice

Edition 55

Strany od

200

Strany do

205

Strany počet

6

URL

https://www.fit.vut.cz/research/publication/6995/

BibTex

@inproceedings{BUT10247,
  author="Josef {Strnadel}",
  title="Normalized Testability Measures Based on RTL Digital Circuit Graph Model Analysis",
  booktitle="Proceedings of The fifth International Scientific Conference Electronic Computers and Informatics 2002",
  year="2002",
  series="Edition 55",
  pages="200--205",
  publisher="The University of Technology Košice",
  address="Košice",
  isbn="80-7099-879-2",
  url="https://www.fit.vut.cz/research/publication/6995/"
}

Dokumenty

2002-eci.pdf