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ŠKARVADA, P. ŠKVARENINA, Ľ. TOMÁNEK, P. SOBOLA, D. MACKŮ, R. BRÜSTLOVÁ, J. GRMELA, L. SMITH, S.
Originální název
Multiscale experimental characterization of solar cell defects
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
The search for alternative sources of renewable energy, including novel photovoltaics structures, is one of the principal tasks of 21th century development. In the field of photovoltaics three generations of solar cells of different structures going from monocrystalline silicon through thin-films to hybrid and organic cells, moreover using nanostructure features are used and studied. Due to the diversity of these structures, their complex study requires the multiscale interpretations bridging time and length scales from macroscale to the atomistic, but also multispectral investigation under different working temperatures. The multiscale study is generally applied to theoretical aspects, but more and more applied to experimental characterization. We investigate multiscale aspects of electrical, optical and material properties of solar cells under illumination and in dark conditions when an external bias is applied. We present the results of a research of the micron and sub-micron defects in a crystalline solar cell structure utilizing scanning probe microscopy and electric noise measurement.
Klíčová slova
solar cell, defect, noise, multiscale, detection, localization
Autoři
ŠKARVADA, P.; ŠKVARENINA, Ľ.; TOMÁNEK, P.; SOBOLA, D.; MACKŮ, R.; BRÜSTLOVÁ, J.; GRMELA, L.; SMITH, S.
Vydáno
24. 12. 2016
Nakladatel
SPIE
Místo
Bellingham, USA
ISBN
9781510607330
Kniha
20th Slovak - Czech - Polish Optical Conference On Wave and Quantum Aspects of Contemporary Optics
Edice
SPIE Proceedings
Číslo edice
10142
ISSN
0277-786X
Periodikum
Proceedings of SPIE
Ročník
Číslo
Stát
Spojené státy americké
Strany od
101420U1
Strany do
101420U7
Strany počet
7