Detail publikace

Single BJT based temperature measurement circuit without MIMC and calibration

LEDVINA, J. KOUDAR, I. HORSKÝ, P.

Originální název

Single BJT based temperature measurement circuit without MIMC and calibration

Typ

článek v časopise ve Web of Science, Jimp

Jazyk

angličtina

Originální abstrakt

This paper presents a temperature measurement circuit which uses only one single Bipolar Junction Transistor for ∆Vbe measurement. This type of measurement is suitable for Complementary Metal–Oxide–Semiconductor (CMOS) processes, where characterized Thermal Sensing Diodes (TSDs) are available. Measurements are based on dynamic biasing which is synchronized with Correlated Double Sampling to suppress 1/f noise, offset and reduce power consumption in the sensor. Furthermore, this work avoids the use of Metal Insulator Metal Capacitors, which might be a cost concern for some designs. Based on these criteria, a test chip was designed and manufactured in standard 110 nm CMOS technology. Without any trimming, an accuracy of ±7.3 °C (3σ) over a temperature range of −40 to 125 °C was achieved. Measurements were performed across one typical wafer and 4 process corner wafers. A single TSD is used as the thermal sensing element. The circuit occupies an area of 0.26 mm2 and has an energy consumption of 1.3 uJ per conversion.

Klíčová slova

Temperature to digital converter, Autocalibration, Correlated double sampling, Offset correction, MIMC free design , Thermal sensing diode

Autoři

LEDVINA, J.; KOUDAR, I.; HORSKÝ, P.

Vydáno

26. 12. 2016

Nakladatel

Springer Analog Integr Circ Sig Process

ISSN

1573-1979

Periodikum

Analog Integrated Circuits and Signal Processing

Ročník

2016

Číslo

12

Stát

Nizozemsko

Strany od

1

Strany do

8

Strany počet

8

URL

http://link.springer.com/article/10.1007/s10470-016-0911-1

BibTex

@article{BUT131241,
  author="Jan {Ledvina} and Ivan {Koudar} and Pavel {Horský}",
  title="Single BJT based temperature measurement circuit without MIMC and calibration",
  journal="Analog Integrated Circuits and Signal Processing",
  year="2016",
  volume="2016",
  number="12",
  pages="1--8",
  doi="10.1007/s10470-016-0911-1",
  issn="1573-1979",
  url="http://link.springer.com/article/10.1007/s10470-016-0911-1"
}