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Detail publikace
ŢĂLU, Ş. PAPEŽ, N. SOBOLA, D. ACHOUR, A. SOLAYMANI, S.
Originální název
Micromorphology investigation of GaAs solar cells: case study on statistical surface roughness parameters
Typ
článek v časopise ve Web of Science, Jimp
Jazyk
angličtina
Originální abstrakt
The purpose of this work is surface characterization of GaAs solar cell using atomic force microscopy. The surface appearance influences the optical properties of the cells. It impacts light trapping and consequently affect the efficiency of the solar cells. In case of nano-structural surface, the properties are strongly depends on its geometrical characteristics. Surface appearance was studied by atomic force microscopy (AFM). Fractal analysis was done by the triangulation method and evaluation of statistical metrics was carrying out on the basis of AFM-data, before and after heating. The results of fractal analysis show the correlation of fractal dimension and statistical characteristics of surface topography. Characterization technique and data processing methodology are essential for description of the surface condition.
Klíčová slova
Solar cells, topography, microscopy, fractal analysis, atomic force microscopy, surface roughness
Autoři
ŢĂLU, Ş.; PAPEŽ, N.; SOBOLA, D.; ACHOUR, A.; SOLAYMANI, S.
Vydáno
3. 7. 2017
Nakladatel
Springer
ISSN
0957-4522
Periodikum
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
Ročník
28
Číslo
15
Stát
Nizozemsko
Strany od
1
Strany do
12
Strany počet
URL
https://link.springer.com/article/10.1007/s10854-017-7422-4
BibTex
@article{BUT137752, author="Ştefan {Ţălu} and Nikola {Papež} and Dinara {Sobola} and Amine {Achour} and Shahram {Solaymani}", title="Micromorphology investigation of GaAs solar cells: case study on statistical surface roughness parameters", journal="JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS", year="2017", volume="28", number="15", pages="1--12", doi="10.1007/s10854-017-7422-4", issn="0957-4522", url="https://link.springer.com/article/10.1007/s10854-017-7422-4" }