Detail publikace

Control of Dynamics of SPM Probes for Non-destructive defectoscopy

Kala Jaroslav

Originální název

Control of Dynamics of SPM Probes for Non-destructive defectoscopy

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Paper describes a control of dynamics of Scanning Probe Microscopy (SPM) and especially STM microscope probes, which are going to be used for non-destructive defectoscopy on surface and subsurface layers of material with nanometer resolution. STM microscope is based on an electron tunnel effect. The tunnel effect proceeds between a probe and a tested sample, where a probe disturbs so called near-field of the material. A principle of STM microscope allows get an information only from material spot which is just under the probe. Therefore have to be used a manipulator to move with the sample under probe to scan whole surface of the material. The piezonanomanipulator is necessary to this movement, this instrument provide movement under the probe with high accuracy of few nanometers. The nanomanipulator can move itself in 3 axis x,y,z, a movement is realized by the help of piezo-crystals, these are feeding by the voltage from 2 to +12 V. Paper is focused on the quality of used nanomanipulator for a mouvement of the sample. Some characteristics of the capacitance sensors, which form feedback of the mouvement, were also presented.

Klíčová slova

nanotechnology, SPM, Dynamics

Autoři

Kala Jaroslav

Rok RIV

2005

Vydáno

29. 4. 2005

Nakladatel

VŠB TU Ostrava

Místo

Ostrava

ISBN

80-248-0774-2

Kniha

Proceedings of XXXth Seminary XXX ASR'05:Instruments and Control '05

Strany od

30

Strany do

37

Strany počet

8

BibTex

@inproceedings{BUT14580,
  author="Jaroslav {Kala}",
  title="Control of Dynamics of SPM Probes for Non-destructive defectoscopy",
  booktitle="Proceedings of XXXth Seminary XXX ASR'05:Instruments and Control '05",
  year="2005",
  pages="8",
  publisher="VŠB TU Ostrava",
  address="Ostrava",
  isbn="80-248-0774-2"
}