Detail publikace

Techniques for Characterization of Integrated Nonlinear Capacitors

SUTORÝ, T.

Originální název

Techniques for Characterization of Integrated Nonlinear Capacitors

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The paper deals with techniques for capacitance characterization of integrated nonlinear capacitors on a chip. Several methods are compared, main part is about CBCM method (Charge-Based Capacitance Measurements) and it's application to the nonlinear capacitance characterization. Since its invention the CBCM method has been extensively used for on-chip interconnect linear capacitance measurements. However, it can be also used for nonlinear device characterization. Application of CBCM to CMOS gate-capacitance measurements is presented.

Klíčová slova v angličtině

capacitance characterization, integrated, nonlinear, capacitors, CBCM method, CMOS gate-capacitance

Autoři

SUTORÝ, T.

Vydáno

28. 4. 2005

Nakladatel

Ing. Zdeněk Novotný CSc., Ondráčkova 105, Brno

Místo

Brno

ISBN

-80-214-2889-9

Kniha

Proceedings of the 11th conference Student EEICT 2005 Volume 2

Číslo edice

první

Strany od

322

Strany do

326

Strany počet

5

BibTex

@inproceedings{BUT14756,
  author="Tomáš {Sutorý}",
  title="Techniques for Characterization of Integrated Nonlinear Capacitors",
  booktitle="Proceedings of the 11th conference Student EEICT 2005 Volume 2",
  year="2005",
  number="první",
  pages="5",
  publisher="Ing. Zdeněk Novotný CSc., Ondráčkova 105, Brno",
  address="Brno",
  isbn="-80-214-2889-9"
}