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TALU, S. SOBOLA, D. SOLAYMANI, S. DALLAEV, R. BRÜSTLOVÁ, J.
Originální název
Scale-dependent Choice of Scanning Rate for AFM Measurements
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
Three samples with different high of topography features were measured at different scanning rate. We also presented statistical and fractal analyses for definition of the surface morphometrics. They can be used for calculation and evaluation of the images' distortion that takes place during scanning rate and proved to be helpful while controlling the measurement. Basing on the results we came to the conclusion that fractal analysis, the statistical surface roughness parameters and AFM may provide us with a deeper understanding of the physical phenomena taking place in the sample-tip interface. This is why, fractal analysis and statistical surface roughness parameters are useful information for the further improvement of calibration system. This approach can be applied for choosing scanning parameters properly, taking into consideration the geometry of the sample and for the microscope calibration by geometrical sizes of features
Klíčová slova
Fractal dimension, Micromorphology, Statistical parameters, Topography
Autoři
TALU, S.; SOBOLA, D.; SOLAYMANI, S.; DALLAEV, R.; BRÜSTLOVÁ, J.
Vydáno
18. 7. 2018
Nakladatel
EStech Transactions on Computer Science and Engineering
ISBN
978-1-60595-065-5
Kniha
DEStech Transactions on Computer Science and Engineering
ISSN
2475-8841
Periodikum
Stát
Spojené státy americké
Strany od
453
Strany do
459
Strany počet
7
URL
http://www.dpi-proceedings.com/index.php/dtcse/article/view/24197
BibTex
@inproceedings{BUT148890, author="Stefan {Talu} and Dinara {Sobola} and Shahram {Solaymani} and Rashid {Dallaev} and Jitka {Brüstlová}", title="Scale-dependent Choice of Scanning Rate for AFM Measurements", booktitle="DEStech Transactions on Computer Science and Engineering", year="2018", journal="DEStech Transactions on Computer Science and Engineering", pages="453--459", publisher="EStech Transactions on Computer Science and Engineering", doi="10.12783/dtcse/cnai2018/24197", isbn="978-1-60595-065-5", issn="2475-8841", url="http://www.dpi-proceedings.com/index.php/dtcse/article/view/24197" }