Detail publikačního výsledku

Application of new measurement method to integrated capacitor characterization

Sutorý, T.

Originální název

Application of new measurement method to integrated capacitor characterization

Anglický název

Application of new measurement method to integrated capacitor characterization

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

A new measurement method has been developed for non-linear integrated capacitor characterization. The paper deals with its application on a test-chip with some test structures of capacitors. The test chip serves for research into methods of nonlinear gate capacitance compensation.

Anglický abstrakt

A new measurement method has been developed for non-linear integrated capacitor characterization. The paper deals with its application on a test-chip with some test structures of capacitors. The test chip serves for research into methods of nonlinear gate capacitance compensation.

Klíčová slova v angličtině

measurement, characterization, compensation, non-linear capacitors, MOS transistors

Autoři

Sutorý, T.

Vydáno

01.01.2005

Nakladatel

Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno

Místo

Brno

ISBN

80-214-3089-3

Kniha

Moderní metody řešení, návrhu a aplikace elektronických obvodů

Strany od

65

Strany počet

6

URL

http://www.urel.feec.vutbr.cz/sbornikH105.pdf

BibTex

@inproceedings{BUT16029,
  author="Tomáš {Sutorý}",
  title="Application of new measurement method to integrated capacitor characterization",
  booktitle="Moderní metody řešení, návrhu a aplikace elektronických obvodů",
  year="2005",
  number="první",
  pages="6",
  publisher="Ing. Zdeněk Novotný, CSc., Ondráčkova 105, Brno",
  address="Brno",
  isbn="80-214-3089-3",
  url="http://www.urel.feec.vutbr.cz/sbornikH105.pdf"
}