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STARKOV, A. STARKOV, I.
Originální název
Electroelastic Field of a Sphere Located in the Vicinity of a Plane Piezoelectric Surface
Typ
článek v časopise ve Web of Science, Jimp
Jazyk
angličtina
Originální abstrakt
The electric field generated by a scanning probe microscope is determined. Analytical expressions for the electroelastic field in a piezoelectric sample and the external electric field are derived for a spherical probe. It is demonstrated that the coupling of elastic and electrostatic fields in the piezoelectric material leads to energy redistribution between such fields. This circumstance causes variations in the normal component of the electric field strength at the interface and the capacitance of a probe.
Klíčová slova
Scanning probe microscope, electroelastic field, pietoelectric material
Autoři
STARKOV, A.; STARKOV, I.
Vydáno
15. 1. 2016
Nakladatel
PLEIADES PUBLISHING INC
Místo
MOSCOW
ISSN
1063-7842
Periodikum
TECHNICAL PHYSICS
Ročník
61
Číslo
1
Stát
Ruská federace
Strany od
23
Strany do
27
Strany počet
5
URL
https://link.springer.com/article/10.1134/S1063784216010217
BibTex
@article{BUT163514, author="Alexander {Starkov} and Ivan {Starkov}", title="Electroelastic Field of a Sphere Located in the Vicinity of a Plane Piezoelectric Surface", journal="TECHNICAL PHYSICS", year="2016", volume="61", number="1", pages="23--27", doi="10.1134/S1063784216010217", issn="1063-7842", url="https://link.springer.com/article/10.1134/S1063784216010217" }