Detail publikace

High-torque Ferrite Assisted Reluctance Machine Winding Comparison

KNEBL, L. BÁRTA, J. VÍTEK, O. ONDRŮŠEK, Č.

Originální název

High-torque Ferrite Assisted Reluctance Machine Winding Comparison

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This paper deals with the investigation of the ideal slots pole combinations for the high-torque ferrite assisted synchronous reluctance machine. The investigation focuses on the ideal slots-poles combinations with respect to developed electromagnetic torque and the torque-ripple while taking into account the amount of torque developed by ferrite magnets. The saliency ratio and the proposed reluctance torque ratio k_rel (ratio between developed reluctance torque and total electromagnetic torque) are illustrated as well. The investigation was not focused on one winding type, but rather to consider various winding types. The investigation goes through the fractional concentrated winding, both single-layer fractional slot and dual-layer fractional slot winding configuration, fractional slot distributed winding and integral slot winding. The main aim of this paper is to compare various winding types and provide useful but still brief comparison, that could serve as a good starting point in development of such a machine.

Klíčová slova

Synchronous reluctance machine; Rotating machines; Finite element analysis; Magnetic flux

Autoři

KNEBL, L.; BÁRTA, J.; VÍTEK, O.; ONDRŮŠEK, Č.

Vydáno

26. 8. 2020

Nakladatel

IEEE

Místo

New York

ISBN

978-1-7281-9945-0

Kniha

USB Proceedings2020 International Conference onElectrical Machines (ICEM)

Strany od

1567

Strany do

1572

Strany počet

6

URL

https://ieeexplore.ieee.org/document/9270910

BibTex

@inproceedings{BUT165924,
  author="Ladislav {Knebl} and Jan {Bárta} and Ondřej {Vítek} and Čestmír {Ondrůšek}",
  title="High-torque Ferrite Assisted Reluctance Machine Winding Comparison",
  booktitle="USB Proceedings2020 International Conference onElectrical Machines (ICEM)",
  year="2020",
  pages="1567--1572",
  publisher="IEEE",
  address="New York",
  doi="10.1109/ICEM49940.2020.9270910",
  isbn="978-1-7281-9945-0",
  url="https://ieeexplore.ieee.org/document/9270910"
}