Detail publikačního výsledku

The Exponential Probe Measurement Using the Direct Ultrasonic Pass-Through Method

ZEZULOVÁ, E.; HEJMAL, Z.; STONIŠ, P.; KOMÁRKOVÁ, T.; HOLUB, J.

Originální název

The Exponential Probe Measurement Using the Direct Ultrasonic Pass-Through Method

Anglický název

The Exponential Probe Measurement Using the Direct Ultrasonic Pass-Through Method

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The article presents 3 different methods for determining the probability of hitting a shape-defined target with a known functional dependence of projectile scattering on distance. The probability of intervention is a basic parameter enabling the analysis of the effectiveness of the weapon system, as well as the synthesis and optimization of the weapon system and firing mode.

Anglický abstrakt

The article presents 3 different methods for determining the probability of hitting a shape-defined target with a known functional dependence of projectile scattering on distance. The probability of intervention is a basic parameter enabling the analysis of the effectiveness of the weapon system, as well as the synthesis and optimization of the weapon system and firing mode.

Klíčová slova

non-destructive testing, ultrasonic testing (UPV method, cylindrical transducers, exponential transducers

Klíčová slova v angličtině

non-destructive testing, ultrasonic testing (UPV method, cylindrical transducers, exponential transducers

Autoři

ZEZULOVÁ, E.; HEJMAL, Z.; STONIŠ, P.; KOMÁRKOVÁ, T.; HOLUB, J.

Rok RIV

2022

Vydáno

04.09.2021

Nakladatel

IEEE Xplore

ISBN

978-1-6654-3724-0

Kniha

2021 International Conference on Military Technologies (ICMT)

Strany od

1

Strany do

5

Strany počet

5

URL

BibTex

@inproceedings{BUT172201,
  author="Eva {Zezulová} and Zdeněk {Hejmal} and Patrik {Stoniš} and Tereza {Komárková} and Jan {Holub}",
  title="The Exponential Probe Measurement Using the Direct Ultrasonic Pass-Through Method",
  booktitle="2021 International Conference on Military Technologies (ICMT)",
  year="2021",
  pages="1--5",
  publisher="IEEE Xplore",
  doi="10.1109/ICMT52455.2021.9502803",
  isbn="978-1-6654-3724-0",
  url="https://ieeexplore.ieee.org/document/9502803"
}