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AHMED, M.
Originální název
Aging studies of atomic layer epitaxy ZnS:Mn alternating-current thin-film electroluminescent devices
Typ
článek ve sborníku ve WoS nebo Scopus
Jazyk
angličtina
Originální abstrakt
A study of the aging behavior of atomic layer epitaxy (ALE) ZnS:Mn alternating-current thin-film electroluminescent (ACTFEL) devices is undertaken by monitoring the internal charge-phosphor field (Q-Fp) and capacitance-voltage (C-V) characteristics as a function of aging time. The electrical properties are asymmetrical with respect to the applied voltage pulse polarity; the aging characteristics of such devices are also asymmetric.
Klíčová slova
atomic layer epitaxy (ALE) ZnS:Mn, ACTFEL device,aging process, internal charge-phosphor field characteristics, capacitance-voltage characteristics
Autoři
Rok RIV
2005
Vydáno
27. 4. 2005
Nakladatel
FEKT VUT
Místo
Brno
ISBN
80-214-2889-9
Kniha
Proceedings of the 11th Conference STUDENT EEICT 2005
Edice
vol.2
Strany od
188
Strany do
192
Strany počet
5
BibTex
@inproceedings{BUT17777, author="Mustafa M. Abdalla {Ahmed}", title="Aging studies of atomic layer epitaxy ZnS:Mn alternating-current thin-film electroluminescent devices", booktitle="Proceedings of the 11th Conference STUDENT EEICT 2005", year="2005", series="vol.2", pages="188--192", publisher="FEKT VUT", address="Brno", isbn="80-214-2889-9" }