Detail publikace

Saving area and power consumption in 65 nm digital standard cell library

KRÁL, V.

Originální název

Saving area and power consumption in 65 nm digital standard cell library

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

This study aims to investigate multi-bit pulsed latches in comparison with multi-bit flip flops as one of the low-power solutions in 65 nm technology process. Topologies of pulse generators and multi-bit pulsed latches were investigated to find out which can be more suitable. The pulse generator was chosen because of its low power and a small area in comparison with other options. The pulse generator is made of a simple AND logical gate and a double-stacked inverter. The pulsed latch was also chosen because of its low power, small area, and reliability of the circuit. The chosen topology is modified PPCLA. Simulations of the chosen topology had shown that multi-bit flip flops could be replaced with more effective multi-bit pulsed latches.

Klíčová slova

digital standard library, integrated circuits, chip development, low power methods, pulse generator, multi-bit pulsed latch

Autoři

KRÁL, V.

Vydáno

26. 4. 2022

Nakladatel

Brno University of Technology, Faculty of Electrical Engineering and Communicatiopn

Místo

Brno

ISBN

978-80-214-6029-4

Kniha

Proceedings I of the 28th Conference STUDENT EEICT 2022 General papers

Edice

1

Strany od

190

Strany do

193

Strany počet

4

URL

https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2022_sbornik_1_v2.pdf

BibTex

@inproceedings{BUT188108,
  author="Vojtěch {Král}",
  title="Saving area and power consumption in 65 nm digital standard cell library",
  booktitle="Proceedings I of the 28th Conference STUDENT EEICT 2022 General papers",
  year="2022",
  series="1",
  pages="190--193",
  publisher="Brno University of Technology, Faculty of Electrical Engineering and Communicatiopn",
  address="Brno",
  isbn="978-80-214-6029-4",
  url="https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2022_sbornik_1_v2.pdf"
}