Automatic test-bench for SiC power devices using LabVIEW

Automatic test-bench for SiC power devices using LabVIEW

Článek WoS

This paper is devoted to the improvement existing models of electronics devices, which are used in powers electronics as switching devices, and investigate a LabVIEW-based automatic test-bench for Silicon carbide (SiC) power devices. In recent years, power electronic devices are required to be capable handle with higher voltage, leads to development of new generation of power electronic devices, such as SiC devices. However, using a simulation platform, such as Spice, to diminish the complexity of power electronic design with these new devices is hindered by the lack of precise models. The proposed test-bench enables not only measuring static characteristics of SiC power devices, but also extracting key parameters required by simulations. These extracted parameters are then employed in the existing device model, and the simulation results which are based on the model with original parameters and models with extracted parameters are compared with measured results. The comparison clearly demonstrates that parameters obtained from the proposed test-bench significantly enhance the Spice model.

This paper is devoted to the improvement existing models of electronics devices, which are used in powers electronics as switching devices, and investigate a LabVIEW-based automatic test-bench for Silicon carbide (SiC) power devices. In recent years, power electronic devices are required to be capable handle with higher voltage, leads to development of new generation of power electronic devices, such as SiC devices. However, using a simulation platform, such as Spice, to diminish the complexity of power electronic design with these new devices is hindered by the lack of precise models. The proposed test-bench enables not only measuring static characteristics of SiC power devices, but also extracting key parameters required by simulations. These extracted parameters are then employed in the existing device model, and the simulation results which are based on the model with original parameters and models with extracted parameters are compared with measured results. The comparison clearly demonstrates that parameters obtained from the proposed test-bench significantly enhance the Spice model.

power electronic devices; SiC; LabVIEW; PSpice; Spice model

power electronic devices; SiC; LabVIEW; PSpice; Spice model

LEUCHTER, J.; PHAM, N.; NGUYEN, H.

2025

01.04.2024

SLOVAK UNIV TECHNOLOGY

BRATISLAVA

1339-309X

Journal of Electrical Engineering-Elektrotechnicky Casopis

75

2

Slovenská republika

77

85

9

https://sciendo.com/article/10.2478/jee-2024-0011

http://hdl.handle.net/11012/245523

Automatic-testbench-for-SiC-power-devices-using-LabVIEW