Detail publikace

X - RAY MICROANALYSIS IN ESEM

J.Špinka, J.Jirák

Originální název

X - RAY MICROANALYSIS IN ESEM

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The X-ray microanalysis performed in ESEM requires to take into account presence of gas in the specimen chamber. The impact of electron scattering causes disadvantageous general increase of concentration limits of executed analysis by additional X-ray peaks contributed by the so called skirt. At X-ray analysis scattered skirt electrons interact with atoms of specimen and produce X-rays but we do not know which X-rays are produced by primary beam and which are produced by skirt electrons. Pressure variation method is described. This method enables extrapolation of X- ray spectral measurements at higher pressures to zero pressure.

Klíčová slova

ESEM, X-ray, microanalysis

Autoři

J.Špinka, J.Jirák

Rok RIV

2006

Vydáno

30. 4. 2006

Nakladatel

TU Brno, Department of Electrotechnolgy

Místo

Brno

ISBN

80-214-3181-4

Kniha

7th Aba BRNO 2006

Strany od

153

Strany do

156

Strany počet

4

BibTex

@inproceedings{BUT21694,
  author="Jiří {Špinka} and Josef {Jirák}",
  title="X - RAY MICROANALYSIS IN ESEM",
  booktitle="7th Aba BRNO 2006",
  year="2006",
  pages="4",
  publisher="TU Brno, Department of Electrotechnolgy",
  address="Brno",
  isbn="80-214-3181-4"
}