Detail publikačního výsledku

The Sub-Band Decomposition of Fluctuated Signal for the Estimation of Power Spectra

GRMELA, L.; ZAJAČEK, J.

Originální název

The Sub-Band Decomposition of Fluctuated Signal for the Estimation of Power Spectra

Anglický název

The Sub-Band Decomposition of Fluctuated Signal for the Estimation of Power Spectra

Druh

Stať ve sborníku v databázi WoS či Scopus

Originální abstrakt

The noise spectroscopy is used to determinate quality and reliability of semiconductor materials. We have used the means of time-frequency analysis for processing of long time duration stochastic signal. Tree-structures FIR filter bank implemented in a recursive way for octave dividing frequency band was designed as full parallel computation algorithm for Power Spectral Density estimation. In the very low frequency area we will obtain high resolution and low level variance of PSD

Anglický abstrakt

The noise spectroscopy is used to determinate quality and reliability of semiconductor materials. We have used the means of time-frequency analysis for processing of long time duration stochastic signal. Tree-structures FIR filter bank implemented in a recursive way for octave dividing frequency band was designed as full parallel computation algorithm for Power Spectral Density estimation. In the very low frequency area we will obtain high resolution and low level variance of PSD

Klíčová slova

1/f noise, power spectral density, FIR, octave filter bank, recursive algorithm

Klíčová slova v angličtině

1/f noise, power spectral density, FIR, octave filter bank, recursive algorithm

Autoři

GRMELA, L.; ZAJAČEK, J.

Vydáno

05.10.2007

Nakladatel

IEEE Spain

Místo

New York

ISBN

1-4244-0829-6

Kniha

Conference Proceeeding Book

Edice

J.U Urena, J.U.Dominguez

Strany od

327

Strany do

332

Strany počet

6

BibTex

@inproceedings{BUT22863,
  author="Lubomír {Grmela} and Jiří {Zajaček}",
  title="The Sub-Band Decomposition of Fluctuated Signal for the Estimation of Power Spectra",
  booktitle="Conference Proceeeding Book",
  year="2007",
  series="J.U Urena, J.U.Dominguez",
  number="07ex1620",
  pages="327--332",
  publisher="IEEE Spain",
  address="New York",
  isbn="1-4244-0829-6"
}