Detail publikace

Noise Sources in the CdTe radiation detectors

GRMELA, L. ANDREEV, A. ŠIKULA, J. ZAJAČEK, J. MORAVEC, P.

Originální název

Noise Sources in the CdTe radiation detectors

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Noise and transport characteristics of CdTe gamma - and X-ray detectors have been carried out to determine the 1/f noise sources and theirs correlation with charge carriers mobility. The noise spectral density was measured by standard set-up. The noise of low ohmic samples has 1/f noise spectral density which increases with the square of voltage. The high ohmic samples revile 1/fa type noise in low frequency range and G-R noise in frequency above 100 Hz. In low frequency range noise spectral is proportional to fourth power of current and then we suppose that main source of noise is in Schottky barrier in vicinity of contacts. We suppose that thickness of the region with dominant contribution to noise decreases with increasing current and total reciprocal number of curriers is proportional to second power of current. Then current noise spectral density is proportional to fourth power of current.

Klíčová slova

Noise, 1/f noise, contact noise, mobility fluctuation, GR spectra, Schottky barrier

Autoři

GRMELA, L.; ANDREEV, A.; ŠIKULA, J.; ZAJAČEK, J.; MORAVEC, P.

Rok RIV

2007

Vydáno

14. 9. 2007

Nakladatel

American Institute of Physics

Místo

Melville, USA

ISBN

978-0-7354-0432-8

Kniha

Noise and Fluctuation - 19-th International Conference on Noise and Fluctuations - ICNF 2007

Edice

M.Tacano, Y.Yamamoto, M.Nakao

Číslo edice

922

Strany od

302

Strany do

305

Strany počet

4

BibTex

@inproceedings{BUT22865,
  author="Lubomír {Grmela} and Alexey {Andreev} and Josef {Šikula} and Jiří {Zajaček} and Pavel {Moravec}",
  title="Noise Sources in the CdTe radiation detectors",
  booktitle="Noise and Fluctuation - 19-th International Conference on Noise and Fluctuations - ICNF 2007",
  year="2007",
  series="M.Tacano, Y.Yamamoto, M.Nakao",
  number="922",
  pages="302--305",
  publisher="American Institute of Physics",
  address="Melville, USA",
  isbn="978-0-7354-0432-8"
}