Detail publikace

The Effect of Contacts Metal - Semiconductor on Low Frequency Noise

ANDREEV, A. ZAJAČEK, J. ŠIKULA, J. GRMELA, L. HOLCMAN, V.

Originální název

The Effect of Contacts Metal - Semiconductor on Low Frequency Noise

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

Flicker noise of CdTe radiation detectors was measured and analyzed. Two CdTe detectors were used for the measurements. Both detectors have p-type conductivity. One of them has low-ohmic contacts (F33B8), another one have high-ohmic contact (452D). The value of flicker noise for both detectors was much higher than theoretical value for CdTe single crystals. It was suggested that the contact area was the source of extra high low frequency noise value. This paper shows the analysis of this possibility

Klíčová slova

1/f noise; contact Metal - Semiconductor

Autoři

ANDREEV, A.; ZAJAČEK, J.; ŠIKULA, J.; GRMELA, L.; HOLCMAN, V.

Rok RIV

2007

Vydáno

1. 8. 2007

Nakladatel

Jozsef Vesza

Místo

Miskolc, Hungary

ISBN

978-963-661-779-0

Kniha

6th International Conference of PhD Students

Edice

1

Číslo edice

1

Strany od

173

Strany do

178

Strany počet

6

BibTex

@inproceedings{BUT23188,
  author="Alexey {Andreev} and Jiří {Zajaček} and Josef {Šikula} and Lubomír {Grmela} and Vladimír {Holcman}",
  title="The Effect of Contacts Metal - Semiconductor on Low Frequency Noise",
  booktitle="6th International Conference of PhD Students",
  year="2007",
  series="1",
  number="1",
  pages="173--178",
  publisher="Jozsef Vesza",
  address="Miskolc, Hungary",
  isbn="978-963-661-779-0"
}