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ANDREEV, A.; ZAJAČEK, J.; ŠIKULA, J.; GRMELA, L.; HOLCMAN, V.
Originální název
The Effect of Contacts Metal - Semiconductor on Low Frequency Noise
Anglický název
Druh
Stať ve sborníku v databázi WoS či Scopus
Originální abstrakt
Flicker noise of CdTe radiation detectors was measured and analyzed. Two CdTe detectors were used for the measurements. Both detectors have p-type conductivity. One of them has low-ohmic contacts (F33B8), another one have high-ohmic contact (452D). The value of flicker noise for both detectors was much higher than theoretical value for CdTe single crystals. It was suggested that the contact area was the source of extra high low frequency noise value. This paper shows the analysis of this possibility
Anglický abstrakt
Klíčová slova
1/f noise; contact Metal - Semiconductor
Klíčová slova v angličtině
Autoři
Vydáno
01.08.2007
Nakladatel
Jozsef Vesza
Místo
Miskolc, Hungary
ISBN
978-963-661-779-0
Kniha
6th International Conference of PhD Students
Edice
1
Strany od
173
Strany do
178
Strany počet
6
BibTex
@inproceedings{BUT23188, author="Alexey {Andreev} and Jiří {Zajaček} and Josef {Šikula} and Lubomír {Grmela} and Vladimír {Holcman}", title="The Effect of Contacts Metal - Semiconductor on Low Frequency Noise", booktitle="6th International Conference of PhD Students", year="2007", series="1", number="1", pages="173--178", publisher="Jozsef Vesza", address="Miskolc, Hungary", isbn="978-963-661-779-0" }