Detail publikačního výsledku

RTL Testability Analysis Based on Circuit Partitioning and Its Link with Professional Tool

ŠKARVADA, J.; HERRMAN, T.; KOTÁSEK, Z.

Originální název

RTL Testability Analysis Based on Circuit Partitioning and Its Link with Professional Tool

Anglický název

RTL Testability Analysis Based on Circuit Partitioning and Its Link with Professional Tool

Druh

Stať ve sborníku mimo WoS a Scopus

Originální abstrakt

The paper presents testability analysis method which is based on partitioning circuit under analysis (CUA) to testable blocks (TBs). A formal approach utilizing the concepts of discrete mathematics is used for this purpose. The partitioning CUA into TBs is further exploited for power consumption optimization during test application. Software tools which were developed during the research and integrated into the third party design tool are also described. Experimental results gained from applying the methodology on selected benchmarks and practical designs are demonstrated.

Anglický abstrakt

The paper presents testability analysis method which is based on partitioning circuit under analysis (CUA) to testable blocks (TBs). A formal approach utilizing the concepts of discrete mathematics is used for this purpose. The partitioning CUA into TBs is further exploited for power consumption optimization during test application. Software tools which were developed during the research and integrated into the third party design tool are also described. Experimental results gained from applying the methodology on selected benchmarks and practical designs are demonstrated.

Klíčová slova

Testable block, power consumption estimation, test vectors generation, power consumption optimization.

Klíčová slova v angličtině

Testable block, power consumption estimation, test vectors generation, power consumption optimization.

Autoři

ŠKARVADA, J.; HERRMAN, T.; KOTÁSEK, Z.

Vydáno

12.10.2007

Nakladatel

Institute of Computing Technology, Chinese Academy of Sciences

Místo

Beijing

Kniha

IEEE 8th Workshop on RTL and High Level Testing

Strany od

175

Strany do

181

Strany počet

7

URL

https://www.fit.vut.cz/research/publication/8487/

BibTex

@inproceedings{BUT26071,
  author="Jaroslav {Škarvada} and Tomáš {Herrman} and Zdeněk {Kotásek}",
  title="RTL Testability Analysis Based on Circuit Partitioning and Its Link with Professional Tool",
  booktitle="IEEE 8th Workshop on RTL and High Level Testing",
  year="2007",
  pages="175--181",
  publisher="Institute of Computing Technology, Chinese Academy of Sciences",
  address="Beijing",
  url="https://www.fit.vut.cz/research/publication/8487/"
}

Dokumenty

wrtlt07