Detail publikace

Fast impedance spectroscopy method for insulating layers with very high impedance

SCHAUER, P.

Originální název

Fast impedance spectroscopy method for insulating layers with very high impedance

Typ

článek ve sborníku ve WoS nebo Scopus

Jazyk

angličtina

Originální abstrakt

The paper presents a fast impedance spectroscopy method for objects with very high impedance |Zx| ? 1G? modeled by RC networks. The method is suitable for predicting lifetime and reliability of insulating materials. Fast impedance spectroscopy method was tested on the insulating layers, which were part of the system metal-insulator-metal (MIM). Method is based on measurements of the power loss and phase shift in the AC voltage divider, which consists of measured system MIM and of the known impedance. Computer controlled instruments measure the gain and phase shift between the two outputs of alternating electrical circuit and computer program calculates parameters of impedance spectroscopy from this values. The outputs are the graphical and tabular impedance characteristics of the MIM system, namely: the dielectric loss of the insulating film, imaginary part of impedance, loss factor, parallel resistance Rp and capacity Cp of MIM system, all frequency dependent. Frequency characteristics provide an analysis of loss mechanisms that may affect the quality and reliability of the insulating layers.

Klíčová slova

impedance spectroscopy

Autoři

SCHAUER, P.

Rok RIV

2009

Vydáno

25. 11. 2009

Nakladatel

CERM

Místo

Brno

ISBN

978-80-7204-671-3

Kniha

7th workshop NDT 2009, non-destructive testing in engineering practice

Strany od

80

Strany do

87

Strany počet

8

BibTex

@inproceedings{BUT32963,
  author="Pavel {Schauer}",
  title="Fast impedance spectroscopy method for insulating layers with very high impedance",
  booktitle="7th workshop NDT 2009, non-destructive testing in engineering practice",
  year="2009",
  pages="80--87",
  publisher="CERM",
  address="Brno",
  isbn="978-80-7204-671-3"
}